发明授权
- 专利标题： PVT variation detection and compensation circuit
- 专利标题（中）： PVT变异检测和补偿电路
-
申请号： US11490439申请日： 2006-07-20
-
公开(公告)号： US07388419B2公开(公告)日： 2008-06-17
- 发明人: Siddhartha Gk , Qadeer A. Khan , Divya Tripathi , Sanjay K Wadhwa , Kulbhushan Misri
- 申请人： Siddhartha Gk , Qadeer A. Khan , Divya Tripathi , Sanjay K Wadhwa , Kulbhushan Misri
- 申请人地址： US TX Austin
- 专利权人： Freescale Semiconductor, Inc
- 当前专利权人： Freescale Semiconductor, Inc
- 当前专利权人地址： US TX Austin
- 代理商 Charles Bergere
- 优先权： IN1926/DEL/2005 20050722
- 主分类号： H01L35/00
- IPC分类号： H01L35/00 ; H01L37/00 ; H03K3/42 ; H03K17/78
摘要：
A compensation circuit and a method for compensating for process, voltage and temperature (PVT) variations in an integrated circuit (IC). The IC includes several functional modules, each of which includes a set of functional units, and generates an output signal in response to an input signal. The compensation circuit includes a code generator and a logic module. The code generator generates a digital code for each functional unit. The digital codes are based on phase differences between the input signal and the output signal. The logic module generates calibration codes based on the digital codes. The calibration codes compensate for the PVT variations in the corresponding functional units.
公开/授权文献
- US20070018712A1 PVT variation detection and compensation circuit 公开/授权日：2007-01-25
信息查询
IPC分类:
