Invention Grant
US07397543B2 Optical reflectometry analysis with a time-adjustment of partial responses 有权
光学反射分析与部分响应的时间调整

  • Patent Title: Optical reflectometry analysis with a time-adjustment of partial responses
  • Patent Title (中): 光学反射分析与部分响应的时间调整
  • Application No.: US11444085
    Application Date: 2006-05-31
  • Publication No.: US07397543B2
    Publication Date: 2008-07-08
  • Inventor: Bernd Nebendahl
  • Applicant: Bernd Nebendahl
  • Applicant Address: US CA Santa Clara
  • Assignee: Agilent Technologies Inc.
  • Current Assignee: Agilent Technologies Inc.
  • Current Assignee Address: US CA Santa Clara
  • Priority: EP05106603 20050719
  • Main IPC: G01N21/00
  • IPC: G01N21/00
Optical reflectometry analysis with a time-adjustment of partial responses
Abstract:
Determining a physical property of a device under test—DUT—includes receiving an optical scatter signal returning from the DUT in response to a probe signal launched into the DUT, wavelength dependent separating a first response signal and a second response signal from the scatter signal, determining a first power information of the first response signal and a second power information of the second response signal, time-adjusting the first power response and the second power response to each other in order to compensate a group velocity difference between the first response signal and the second response signal within the DUT, and determining the physical property on the base of the time-adjusted power responses.
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