Invention Grant
- Patent Title: Optical reflectometry analysis with a time-adjustment of partial responses
- Patent Title (中): 光学反射分析与部分响应的时间调整
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Application No.: US11444085Application Date: 2006-05-31
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Publication No.: US07397543B2Publication Date: 2008-07-08
- Inventor: Bernd Nebendahl
- Applicant: Bernd Nebendahl
- Applicant Address: US CA Santa Clara
- Assignee: Agilent Technologies Inc.
- Current Assignee: Agilent Technologies Inc.
- Current Assignee Address: US CA Santa Clara
- Priority: EP05106603 20050719
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
Determining a physical property of a device under test—DUT—includes receiving an optical scatter signal returning from the DUT in response to a probe signal launched into the DUT, wavelength dependent separating a first response signal and a second response signal from the scatter signal, determining a first power information of the first response signal and a second power information of the second response signal, time-adjusting the first power response and the second power response to each other in order to compensate a group velocity difference between the first response signal and the second response signal within the DUT, and determining the physical property on the base of the time-adjusted power responses.
Public/Granted literature
- US20070018635A1 Optical reflectometry analysis with a time-adjustment of partial responses Public/Granted day:2007-01-25
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