发明授权
US07416991B2 High resolution patterning of surface energy utilizing high resolution monomolecular resist for fabrication of patterned media masters
有权
利用高分辨率单分子抗蚀剂制造图案化媒体大师的表面能的高分辨率图案化
- 专利标题: High resolution patterning of surface energy utilizing high resolution monomolecular resist for fabrication of patterned media masters
- 专利标题(中): 利用高分辨率单分子抗蚀剂制造图案化媒体大师的表面能的高分辨率图案化
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申请号: US11433019申请日: 2006-05-11
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公开(公告)号: US07416991B2公开(公告)日: 2008-08-26
- 发明人: Zvonimir Z. Bandic , Bernhard E. Knigge , Charles Mathew Mate
- 申请人: Zvonimir Z. Bandic , Bernhard E. Knigge , Charles Mathew Mate
- 申请人地址: NL Amsterdam
- 专利权人: Hitachi Global Storage Technologies Netherlands B. V.
- 当前专利权人: Hitachi Global Storage Technologies Netherlands B. V.
- 当前专利权人地址: NL Amsterdam
- 代理机构: Zilka-Kotab, PC
- 主分类号: H01L21/302
- IPC分类号: H01L21/302
摘要:
A method for patterning and forming very small structures on a substrate such as a wafer. The process uses a difference in surface energy between a mask and the substrate to selectively deposit a hard mask material such as a metal onto the surface of the substrate. The mask can be formed extremely thin, such as only an atomic mono-layer thick, and can be patterned by ion beam photolithography. The pattern can, therefore, be formed with extremely high resolution. The thin mask layer can be constructed of various materials and can be constructed of perfluorpolyether diacrylate (PDA), which can be dip coated to and exposed to form a desirable positive photoresist mask layer.
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