发明授权
- 专利标题： Efficient method of test and soft repair of SRAM with redundancy
- 专利标题（中）： SRAM冗余测试和软修复的高效方法
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申请号： US11056726申请日： 2005-02-11
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公开(公告)号： US07437626B2公开(公告)日： 2008-10-14
- 发明人: Tom Y. Chang , William V. Huott , Thomas J. Knips , Donald W. Plass
- 申请人： Tom Y. Chang , William V. Huott , Thomas J. Knips , Donald W. Plass
- 申请人地址： US NY Armonk
- 专利权人： International Business Machines Corporation
- 当前专利权人： International Business Machines Corporation
- 当前专利权人地址： US NY Armonk
- 代理商 Lynn L. Augspurger
- 主分类号： G11C29/00
- IPC分类号： G11C29/00
摘要：
Memory array built in self testing utilizing including a simple data history table. The table is used to track failing locations observed during any level of assembly test of processor or logic semiconductor chips where the chips contain SRAM macros with redundant elements for failure relief.