发明授权
- 专利标题: On-chip jitter measurement circuit
- 专利标题(中): 片上抖动测量电路
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申请号: US10638825申请日: 2003-08-11
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公开(公告)号: US07439724B2公开(公告)日: 2008-10-21
- 发明人: David F. Heidel , Keith A. Jenkins
- 申请人: David F. Heidel , Keith A. Jenkins
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 代理机构: F. Chau & Associates, LLC
- 主分类号: G01R23/00
- IPC分类号: G01R23/00 ; H04L7/00 ; H03L7/06
摘要:
An on-chip jitter measurement circuit and corresponding method are provided for receiving a reference clock and a signal of interest, including a latch for comparing the arrival time of the signal of interest to the reference clock, a delay chain in signal communication with the reference clock for varying the arrival time of the reference clock, the delay chain having a first stage, a middle stage, and a last stage, a voltage controller in signal communication with the middle stage of the delay chain for controlling the delay of the arrival time of the reference clock while permitting the first and last stages of the delay chain to retain a full voltage swing independent of the delay.
公开/授权文献
- US20050036578A1 On-chip jitter measurement circuit 公开/授权日:2005-02-17
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