- 专利标题: Bonding structure with buffer layer and method of forming the same
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申请号: US11619612申请日: 2007-01-04
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公开(公告)号: US07446421B2公开(公告)日: 2008-11-04
- 发明人: Su-Tsai Lu , Shu-Ming Chang , Shyh-Ming Chang , Yao-Sheng Lin , Yuan-Chang Huang
- 申请人: Su-Tsai Lu , Shu-Ming Chang , Shyh-Ming Chang , Yao-Sheng Lin , Yuan-Chang Huang
- 申请人地址: TW Hsinchu
- 专利权人: Industrial Technology Research Institute
- 当前专利权人: Industrial Technology Research Institute
- 当前专利权人地址: TW Hsinchu
- 优先权: TW92132948A 20031124
- 主分类号: H01L23/48
- IPC分类号: H01L23/48 ; H05K1/11
摘要:
A bonding structure with a buffer layer, and a method of forming the same are provided. The bonding structure comprises a first substrate with metal pads thereon, a protection layer covered on the surface of the substrate, a first adhesive metal layer formed on the metal pads, a buffer layer coated on the protection layer and the metal pads, a first metal layer covered on the buffer layer, and a second substrate with electrodes and a bonding layer thereon. The first metal layer, the electrodes and the bonding layer are bonded to form the bonding structure. Direct bonding can be performed through surface activation or heat pressure. The method uses fewer steps and is more reliable. The temperature required for bonding the structure is lower. The bonding density between the contacted surfaces is increased to a fine pitch. The quality at the bonding points is increased because fewer contaminations between the contacted surfaces are generated.
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