发明授权
US07446542B2 Apparatus and method for automated stress testing of flip-chip packages
失效
倒装芯片封装自动应力测试的装置和方法
- 专利标题: Apparatus and method for automated stress testing of flip-chip packages
- 专利标题(中): 倒装芯片封装自动应力测试的装置和方法
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申请号: US11367562申请日: 2006-03-03
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公开(公告)号: US07446542B2公开(公告)日: 2008-11-04
- 发明人: Lyudmila Zaykova-Feldman , Thomas M. Moore
- 申请人: Lyudmila Zaykova-Feldman , Thomas M. Moore
- 申请人地址: US TX Dallas
- 专利权人: Omniprobe, Inc.
- 当前专利权人: Omniprobe, Inc.
- 当前专利权人地址: US TX Dallas
- 代理商 John A. Thomas
- 主分类号: G01R31/302
- IPC分类号: G01R31/302 ; G01R31/28
摘要:
An apparatus for testing flip-chip packages has a programmed computer, a test-engine stage for applying an impact to at least one package under test, and a monitoring stage. The test-engine stage causes an impact on the package on the side opposite its ball-grid array. The test-engine stage has actuators connected to the test-engine stage and the computer, for moving and aligning the test-engine stage. The monitoring stage has a digital camera connected to the computer for transmitting digital images from the ball-grid array side of the package to the computer. A microscope is preferably connected to the digital camera. A sample stage located between the test-engine stage and the monitoring stage holds the package under test. The sample stage has an acoustic transducer capable of being removably connected to the package under test. The acoustic transducer is connected to the computer for transmitting signals from the acoustic transducer to the computer.
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