Invention Grant
US07446967B2 Method of measuring head characteristics of a data storage device, and data storage device
失效
测量数据存储装置的头部特性的方法和数据存储装置
- Patent Title: Method of measuring head characteristics of a data storage device, and data storage device
- Patent Title (中): 测量数据存储装置的头部特性的方法和数据存储装置
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Application No.: US11222913Application Date: 2005-09-08
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Publication No.: US07446967B2Publication Date: 2008-11-04
- Inventor: Minoru Hashimoto , Kenji Okada , Fuminori Sai , Chikako Sasaki , Satoshi Yamamoto
- Applicant: Minoru Hashimoto , Kenji Okada , Fuminori Sai , Chikako Sasaki , Satoshi Yamamoto
- Applicant Address: NL Amsterdam
- Assignee: Hitachi Global Storage Technologies Netherlands B.V.
- Current Assignee: Hitachi Global Storage Technologies Netherlands B.V.
- Current Assignee Address: NL Amsterdam
- Agency: Townsend and Townsend and Crew LLP
- Agent Patrick Duncan
- Priority: JP2004-267531 20040914
- Main IPC: G11B21/02
- IPC: G11B21/02

Abstract:
Embodiments of the invention relate to measuring characteristics of a head with an actuator put in a state of being pushed against a crush stop. In one embodiment, with a head placed on an innermost ID side or with the current of a VCM sustained at a magnitude I_mid, a burst pattern is written onto a recording disk. At this stage, the gain of a VGA is equal to its maximum value Gmax. Then, while the current of the VCM is being changed gradually, the gain of the VCA is measured. As the current of the VCM becomes equal to a magnitude I_center, a read element of the head is positioned right above the burst pattern. At that time, the gain of a VGA is equal to its minimum value Gmin. As the read element is further moved to the OD side, the gain of the VGA again becomes equal to the maximum value Gmax. A read/write offset of the head is identified by the magnitudes I_center and I_mid.
Public/Granted literature
- US20060056097A1 Method of measuring head characteristics of a data storage device, and data storage device Public/Granted day:2006-03-16
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