Invention Grant
- Patent Title: Method of fabricating poly silicon layer
- Patent Title (中): 制造多晶硅层的方法
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Application No.: US11308961Application Date: 2006-05-30
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Publication No.: US07449377B2Publication Date: 2008-11-11
- Inventor: Chiung-Wei Lin , Sheng-Chi Lee , Yi-Liang Chen , Rui-Cheng Huang , Te-Hua Teng
- Applicant: Chiung-Wei Lin , Sheng-Chi Lee , Yi-Liang Chen , Rui-Cheng Huang , Te-Hua Teng
- Applicant Address: TW Taoyuan
- Assignee: Chunghwa Picture Tubes, Ltd.
- Current Assignee: Chunghwa Picture Tubes, Ltd.
- Current Assignee Address: TW Taoyuan
- Agency: Jianq Chyun IP Office
- Main IPC: H01L21/84
- IPC: H01L21/84

Abstract:
A method of fabricating a poly silicon layer comprising the following steps is provided. First, a substrate is provided and an amorphous silicon layer is formed on the substrate. A patterned metal layer is formed on the amorphous silicon layer. Next, a pulsed rapid thermal annealing process is performed to form a metal silicide between the patterned metal layer and the amorphous silicon layer, wherein the patterned metal layer and the amorphous silicon layer are adopted for conducting thermal energy to the amorphous silicon layer such that the amorphous silicon layer is converted into a polysilicon layer. Finally, the patterned metal layer is removed. Accordingly, the above processes may prevent the poly silicon layer from metal contamination.
Public/Granted literature
- US20070281404A1 POLY SILICON LAYER AND METHOD OF FABRICATING THE SAME Public/Granted day:2007-12-06
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