Invention Grant
US07459682B2 Spin-polarized electron source and spin-polarized scanning tunneling microscope
有权
自旋极化电子源和自旋极化扫描隧道显微镜
- Patent Title: Spin-polarized electron source and spin-polarized scanning tunneling microscope
- Patent Title (中): 自旋极化电子源和自旋极化扫描隧道显微镜
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Application No.: US11559842Application Date: 2006-11-14
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Publication No.: US07459682B2Publication Date: 2008-12-02
- Inventor: Wen-Hui Duan , Shao-Gang Hao , Gang Zhou , Jian Wu , Bing-Lin Gu
- Applicant: Wen-Hui Duan , Shao-Gang Hao , Gang Zhou , Jian Wu , Bing-Lin Gu
- Applicant Address: CN Beijing TW Tu-Cheng, Taipei Hsien
- Assignee: Tsinghua University,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Tsinghua University,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Beijing TW Tu-Cheng, Taipei Hsien
- Priority: CN200610060733 20060519
- Main IPC: G01N23/00
- IPC: G01N23/00

Abstract:
An exemplary spin-polarized electron source includes a cathode, and a one-dimensional nanostructure made of a compound (e.g., group III-V) semiconductor with local polarized gap states. The one-dimensional nanostructure includes a first end portion electrically connected with the cathode and a second end portion located/directed away from the cathode. The second end portion of the one-dimensional nanostructure functions as a polarized electron emission tip and is configured (i.e., structured and arranged) for emitting a spin-polarized electron current/beam under an effect of selectably one of a magnetic field induction and a circularly polarized light beam excitation when a predetermined negative bias voltage is applied to the cathode. Furthermore, a spin-polarized scanning tunneling microscope incorporating such a spin-polarized electron source is also provided.
Public/Granted literature
- US20080073554A1 SPIN-POLARIZED ELECTRON SOURCE AND SPIN-POLARIZED SCANNING TUNNELING MICROSCOPE Public/Granted day:2008-03-27
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