Invention Grant
- Patent Title: Methods of probing an electronic device
- Patent Title (中): 探测电子设备的方法
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Application No.: US11748988Application Date: 2007-05-15
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Publication No.: US07463043B2Publication Date: 2008-12-09
- Inventor: Timothy E. Cooper , Benjamin N. Eldridge , Igor Y. Khandros , Rod Martens , Gaetan L. Mathieu
- Applicant: Timothy E. Cooper , Benjamin N. Eldridge , Igor Y. Khandros , Rod Martens , Gaetan L. Mathieu
- Applicant Address: US CA Livermore
- Assignee: FormFactor, Inc.
- Current Assignee: FormFactor, Inc.
- Current Assignee Address: US CA Livermore
- Agent N. Kenneth Burraston
- Main IPC: G01R31/02
- IPC: G01R31/02
Abstract:
An electronic device is moved into a first position such that terminals of the electronic device are adjacent probes for making electrical contact with the terminals. The electronic device is then moved horizontally or diagonally such that the terminals contact the probes. Test data are then communicated to and from the electronic device through the probes.
Public/Granted literature
- US20070262767A1 PROBING A DEVICE Public/Granted day:2007-11-15
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