发明授权
US07470499B2 Alicyclic unsaturated compound, polymer, chemically amplified resist composition and method for forming pattern using said composition 失效
脂环族不饱和化合物,聚合物,化学增幅抗蚀剂组合物和使用所述组合物形成图案的方法

  • 专利标题: Alicyclic unsaturated compound, polymer, chemically amplified resist composition and method for forming pattern using said composition
  • 专利标题(中): 脂环族不饱和化合物,聚合物,化学增幅抗蚀剂组合物和使用所述组合物形成图案的方法
  • 申请号: US10548067
    申请日: 2004-03-04
  • 公开(公告)号: US07470499B2
    公开(公告)日: 2008-12-30
  • 发明人: Katsumi MaedaKaichiro Nakano
  • 申请人: Katsumi MaedaKaichiro Nakano
  • 申请人地址: JP Tokyo
  • 专利权人: NEC Corporation
  • 当前专利权人: NEC Corporation
  • 当前专利权人地址: JP Tokyo
  • 代理机构: McGinn IP Law Group, PLLC
  • 优先权: JP2003-059804 20030306
  • 国际申请: PCT/JP2004/002728 WO 20040304
  • 国际公布: WO2004/078688 WO 20040916
  • 主分类号: G03F7/039
  • IPC分类号: G03F7/039 G08F32/08 C07C35/52 C07C69/65 C07C43/178
Alicyclic unsaturated compound, polymer, chemically amplified resist composition and method for forming pattern using said composition
摘要:
A noble alicyclic unsaturated compound represented by the general formula (1): wherein at least one of R1 and R2 is a fluorine atom or a fluorinated alkyl group; a polymer formed by the polymerization of a polymer precursor comprising the alicyclic compound. The polymer is useful, in the lithography using a light having a wavelength of 190 nm or less, as a chemically amplified resist which exhibits excellent transparency with respect to the light for use in exposure and also is excellent in the adhesion to a substrate and the resistance to dry etching.
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