Invention Grant
US07477960B2 Fault detection and classification (FDC) using a run-to-run controller
有权
故障检测和分类(FDC)使用运行到运行的控制器
- Patent Title: Fault detection and classification (FDC) using a run-to-run controller
- Patent Title (中): 故障检测和分类(FDC)使用运行到运行的控制器
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Application No.: US11058321Application Date: 2005-02-16
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Publication No.: US07477960B2Publication Date: 2009-01-13
- Inventor: James E. Willis , Merritt Funk , Kevin Lally , Kevin Pinto , Masayuki Tomoyasu , Raymond Peterson , Radha Sundararajan
- Applicant: James E. Willis , Merritt Funk , Kevin Lally , Kevin Pinto , Masayuki Tomoyasu , Raymond Peterson , Radha Sundararajan
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, P.C.
- Main IPC: G06F19/00
- IPC: G06F19/00

Abstract:
A method for implementing FDC in an APC system including receiving an FDC model from memory; providing the FDC model to a process model calculation engine; computing a vector of predicted dependent process parameters using the process model calculation engine; receiving a process recipe comprising a set of recipe parameters, providing the process recipe to a process module; executing the process recipe to produce a vector of measured dependent process parameters; calculating a difference between the vector of predicted dependent process parameters and the vector of measured dependent process parameters; comparing the difference to a threshold value; and declaring a fault condition when the difference is greater than the threshold value.
Public/Granted literature
- US20060184264A1 Fault detection and classification (FDC) using a run-to-run controller Public/Granted day:2006-08-17
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