发明授权
- 专利标题: Debugging system for gate level IC designs
- 专利标题(中): 门级IC设计调试系统
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申请号: US11342125申请日: 2006-01-26
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公开(公告)号: US07478346B2公开(公告)日: 2009-01-13
- 发明人: Yu-Chin Hsu , Furshing Tsai , Wori-Tzy Jong
- 申请人: Yu-Chin Hsu , Furshing Tsai , Wori-Tzy Jong
- 申请人地址: US CA San Jose
- 专利权人: Springsoft USA, Inc.
- 当前专利权人: Springsoft USA, Inc.
- 当前专利权人地址: US CA San Jose
- 代理机构: Smith-Hill and Bedell
- 代理商 Daniel J. Bedell
- 主分类号: G06F17/50
- IPC分类号: G06F17/50 ; G06F9/45
摘要:
A synthesizer or emulator processes a gate level IC design derived from an RTL design to produce a gate level dump file indicating how signals of the gate level design behave. The gate level dump file is converted into an RTL dump file indicating how signals of the RTL design behave. A debugger processes the RTL dump file to produce displays depicting the RTL design and behavior of signals indicated by the RTL dump file. Thus while the IC is simulated or emulated at the gate level of the design to produce waveform data for a debugger, the gate level-to-RTL dump file conversion process enables a designer debug the more familiar RTL design based on the gate level simulation or emulation results. file conversion process enables a designer debug the more familiar RTL design based on the gate level simulation or emulation results.
公开/授权文献
- US20070174805A1 Debugging system for gate level IC designs 公开/授权日:2007-07-26
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