Debugging system for gate level IC designs
    1.
    发明授权
    Debugging system for gate level IC designs 有权
    门级IC设计调试系统

    公开(公告)号:US07478346B2

    公开(公告)日:2009-01-13

    申请号:US11342125

    申请日:2006-01-26

    IPC分类号: G06F17/50 G06F9/45

    CPC分类号: G06F17/5022

    摘要: A synthesizer or emulator processes a gate level IC design derived from an RTL design to produce a gate level dump file indicating how signals of the gate level design behave. The gate level dump file is converted into an RTL dump file indicating how signals of the RTL design behave. A debugger processes the RTL dump file to produce displays depicting the RTL design and behavior of signals indicated by the RTL dump file. Thus while the IC is simulated or emulated at the gate level of the design to produce waveform data for a debugger, the gate level-to-RTL dump file conversion process enables a designer debug the more familiar RTL design based on the gate level simulation or emulation results. file conversion process enables a designer debug the more familiar RTL design based on the gate level simulation or emulation results.

    摘要翻译: 合成器或仿真器处理从RTL设计派生的门级IC设计,以产生指示门级设计的信号行为的门级转储文件。 门级转储文件转换为RTL转储文件,指示RTL设计的信号如何运行。 调试器处理RTL转储文件以产生描绘RTL转换文件指示的信号的RTL设计和行为的显示。 因此,当IC在设计的门级模拟或仿真以产生调试器的波形数据时,门级到RTL转储文件转换过程使得设计者能够根据门级仿真或调试更熟悉的RTL设计, 仿真结果。 文件转换过程使设计人员能够根据门级仿真或仿真结果调试更熟悉的RTL设计。

    Insulated structure of a chip array component and fabrication method of the same
    2.
    发明申请
    Insulated structure of a chip array component and fabrication method of the same 有权
    芯片阵列组件的绝缘结构及其制造方法

    公开(公告)号:US20060017179A1

    公开(公告)日:2006-01-26

    申请号:US10896975

    申请日:2004-07-23

    IPC分类号: H01L23/48

    CPC分类号: H01G2/10 H01G2/20

    摘要: An insulated structure of a chip array component and fabrication method of the same, the element is fabricated by enclosing its main body with a dense layer of high surface insulation resistance material, and then exposing the portions of the main body where terminal electrodes are to be formed by removing the dense layer of high surface insulation resistance material by employing sand blasting, laser trimming, grinding, or etching process.

    摘要翻译: 芯片阵列元件的绝缘结构及其制造方法,通过将其主体用高表面绝缘电阻材料的致密层封闭,然后将端子电极的主体部分露出而制造 通过使用喷砂,激光修整,研磨或蚀刻工艺除去高表面绝缘电阻材料的致密层而形成。

    Disposable serial package and monitoring system thereof
    5.
    发明申请
    Disposable serial package and monitoring system thereof 审中-公开
    一次性串行包及其监控系统

    公开(公告)号:US20070125868A1

    公开(公告)日:2007-06-07

    申请号:US11437663

    申请日:2006-05-22

    IPC分类号: G06K19/06

    摘要: A disposable serial package and its monitoring system are proposed. Conductive structures are provided on each of several package units detachably attached in series forming the disposable serial package. Each conductive structure has several leads and each of the leads has a front end and a tail end. The tail end of a second lead being connected to a first lead on the same conductive structure and a third lead of any one of the package units is connected to the front end of the second lead of a succeeding package unit. A monitoring device is cooperatively used to allow setting of the quantity of package units to be monitored and the instantaneous quantity of package units based on the conducting state of the leads.

    摘要翻译: 提出了一次性串行包及其监控系统。 导电结构设置在几个可拆卸地串联连接形成一次性串行封装的封装单元中。 每个导电结构具有多个引线,并且每个引线具有前端和尾端。 第二引线的尾端连接到同一导电结构上的第一引线,并且任一个封装单元的第三引线连接到后续封装单元的第二引线的前端。 协调使用监控装置,以便基于引线的导通状态来设定要监视的封装单元的数量和封装单元的瞬时量。

    Method and apparatus for versatile controllability and observability in prototype system
    6.
    发明授权
    Method and apparatus for versatile controllability and observability in prototype system 有权
    在原型系统中通用的可控性和可观察性的方法和装置

    公开(公告)号:US08281280B2

    公开(公告)日:2012-10-02

    申请号:US13025809

    申请日:2011-02-11

    IPC分类号: G06F17/50

    CPC分类号: G06F17/5027

    摘要: Methods and systems for testing a design under verification (DUV), the method including receiving, at an interface, configured Field Programmable Gate Array (FPGA) images and runtime control information, wherein each of the FPGA images contains a respective portion of the DUV, and a respective verification module associated with a respective FPGA device. The method further includes, sending, by the interface, each of the FPGA images to each of the respective FPGA devices associated with each of the respective FPGA images. The method also includes, sending, by the interface, timing and control information to each of the respective verification modules based on runtime control information received from the host workstation. In response to receiving timing and control information, each of the respective verification modules, controls each of the respective portions of the DUV in each of the respective FPGA devices.

    摘要翻译: 用于测试验证设计(DUV)的方法和系统,所述方法包括在接口处接收配置的现场可编程门阵列(FPGA)图像和运行时间控制信息,其中每个FPGA图像包含DUV的相应部分, 以及与相应的FPGA器件相关联的相应的验证模块。 该方法还包括:通过接口将每个FPGA图像发送到与每个相应FPGA图像相关联的每个相应的FPGA器件。 该方法还包括:基于从主机工作站接收的运行时控制信息,通过接口将定时和控制信息发送到各个验证模块。 响应于接收到的定时和控制信息,各个验证模块中的每一个控制各个FPGA器件中的每一个的DUV的各个部分。

    Holder
    7.
    外观设计
    Holder 有权

    公开(公告)号:USD608771S1

    公开(公告)日:2010-01-26

    申请号:US29311551

    申请日:2009-04-20

    申请人: Yu-Chin Hsu

    设计人: Yu-Chin Hsu

    Incremental circuit re-simulation system
    8.
    发明授权
    Incremental circuit re-simulation system 有权
    增量电路重仿真系统

    公开(公告)号:US07571086B2

    公开(公告)日:2009-08-04

    申请号:US11267726

    申请日:2005-11-04

    IPC分类号: G06F17/50

    CPC分类号: G06F17/5022

    摘要: A netlist description of a circuit is processed to classify some signals of the circuit as essential signals and to classify all other signals of the circuit as non-essential signals. Thereafter when simulating behavior of the entire circuit in response to input signals supplied over some time interval, a simulator saves first simulation data representing behavior of the circuit's essential signals during the time interval. Thereafter the simulator is programmed to re-simulate behavior of only a selected subcircuit of the circuit during only a selected subinterval of the full time interval based on behavior of essential signals described by the first simulation data. During the re-simulation, the simulator saves second simulation data representing behavior of both essential and non-essential signals of the subcircuit to provide a more complete picture of the behavior of the selected subcircuit during the selected subinterval. Before the initial full-circuit simulation, each signal is classified as an essential signal when its behavior during the full-circuit simulation must be represented by the first simulation data in order to provide sufficient information to program the simulator to re-simulate the behavior any selected subcircuit during any selected subinterval. All other circuit signals are classified as non-essential signals whose behavior need not be represented by the saved first simulation data.

    摘要翻译: 处理电路的网表描述,将电路的一些信号分类为基本信号,并将电路的所有其他信号分类为非必要信号。 此后,当模拟响应于在一段时间间隔内提供的输入信号的整个电路的行为时,模拟器在时间间隔期间保存表示电路的基本信号的行为的第一仿真数据。 此后,根据由第一仿真数据描述的基本信号的行为,将模拟器编程为仅在全时间间隔的选定子间隔期间再次仅模拟电路的选定子电路的行为。 在重新仿真期间,模拟器保存表示子电路的基本信号和非必要信号的二次仿真数据,以提供所选择的子间隔期间所选择的子电路的行为的更完整的图像。 在初始全电路仿真之前,每个信号被分类为必要信号,当其全电路仿真期间的行为必须由第一仿真数据表示,以便提供足够的信息来编程仿真器以重新模拟任何 在任何选择的子间隔期间选择子电路。 所有其他电路信号被分类为非必要信号,其行为不需要由保存的第一模拟数据表示。

    IC behavior analysis system
    9.
    发明授权
    IC behavior analysis system 有权
    IC行为分析系统

    公开(公告)号:US07079997B1

    公开(公告)日:2006-07-18

    申请号:US10143347

    申请日:2002-05-10

    IPC分类号: G06F17/50

    CPC分类号: G06F17/5022

    摘要: A debugger produces a display based on instructions executed by a circuit simulator or verification tool and on waveform data produced by the simulator or verification tool when executing the instructions. The instructions include a set of statements, each corresponding to a separate circuit signal generated by a circuit and each including a function defining a value of the circuit signal as a function of values of other circuit signals. The simulator evaluates the statements at various simulation times to compute signal values at those simulation times. The waveform data indicates signal values the simulator computes when evaluating the statements. The debugger display includes a set of statement event symbols, each corresponding to a separate evaluation of a statement and each positioned in the display to indicate a simulation time at which the simulator evaluated the statement. Each statement event symbol references the signal whose value is computed by the corresponding statement evaluation and indicates a value of that signal computed when the statement was evaluated. Each statement event symbol also references the other signals having values of which the statement indicates the computed signal value is a function and indicates those other signals values as of the simulation time at which the statement was evaluated.

    摘要翻译: 调试器根据由电路仿真器或验证工具执行的指令以及在执行指令时由仿真器或验证工具产生的波形数据产生显示。 指令包括一组语句,每个语句对应于由电路产生的单独的电路信号,并且每个语句包括定义电路信号的值作为其他电路信号的值的函数的函数。 模拟器在各种模拟时间对语句进行评估,以在这些模拟时间计算信号值。 波形数据表示模拟器在评估语句时计算的信号值。 调试器显示包括一组语句事件符号,每个对应于语句的单独评估,并且每个语句事件符号分别位于显示器中,以指示模拟器评估该语句的模拟时间。 每个语句事件符号引用其值由相应的语句评估计算的信号,并指示在评估语句时计算的该信号的值。 每个语句事件符号还引用具有值的其他信号,其中语句指示计算的信号值是函数,并且指示在评估语句时的模拟时间的那些其他信号值。