发明授权
US07485536B2 Abrupt junction formation by atomic layer epitaxy of in situ delta doped dopant diffusion barriers 有权
通过原子层外延原位δ掺杂掺杂剂扩散阻挡层的突变结形成

Abrupt junction formation by atomic layer epitaxy of in situ delta doped dopant diffusion barriers
摘要:
A method including forming a channel region between source and drain regions in a substrate, the channel region including a first dopant profile; and forming a barrier layer between the channel region and a well of the substrate, the barrier layer including a second dopant profile different from the first dopant profile. An apparatus including a gate electrode on a substrate; source and drain regions formed in the substrate and separated by a channel region; and a barrier layer between a well of the substrate and the channel region, the barrier layer including a dopant profile different than a dopant profile of the channel region and different than a dopant profile of the well. A system including a computing device including a microprocessor, the microprocessor including a plurality of transistor devices formed in a substrate, each of the plurality of transistor devices including a gate electrode on the substrate; source and drain regions formed in the substrate and separated by a channel region; and a barrier layer between a well of the substrate and the channel region.
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