Invention Grant
- Patent Title: Shielded probe for testing a device under test
- Patent Title (中): 用于测试被测设备的屏蔽探头
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Application No.: US11977280Application Date: 2007-10-24
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Publication No.: US07489149B2Publication Date: 2009-02-10
- Inventor: K. Reed Gleason , Tim Lesher , Eric W. Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr M. E. Safwat
- Applicant: K. Reed Gleason , Tim Lesher , Eric W. Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr M. E. Safwat
- Applicant Address: US OR Beaverton
- Assignee: Cascade Microtech, Inc.
- Current Assignee: Cascade Microtech, Inc.
- Current Assignee Address: US OR Beaverton
- Agency: Chernoff, Vilhauer, McClung & Stenzel
- Main IPC: G01R11/67
- IPC: G01R11/67
Abstract:
A probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies may include a dielectric substrate that supports a signal path interconnecting test instrumentation and a probe tip and a ground path that shields both the signal oath and the probe tip.
Public/Granted literature
- US20080054929A1 Probe for testing a device under test Public/Granted day:2008-03-06
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