发明授权
- 专利标题: Apparatus for measuring jitter and method of measuring jitter
- 专利标题(中): 用于测量抖动的装置和测量抖动的方法
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申请号: US11137786申请日: 2005-05-25
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公开(公告)号: US07496137B2公开(公告)日: 2009-02-24
- 发明人: Kiyotaka Ichiyama , Masahiro Ishida , Takahiro Yamaguchi , Mani Soma
- 申请人: Kiyotaka Ichiyama , Masahiro Ishida , Takahiro Yamaguchi , Mani Soma
- 申请人地址: JP Tokyo
- 专利权人: Advantest Corporation
- 当前专利权人: Advantest Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Osha • Liang LLP
- 主分类号: H04B3/46
- IPC分类号: H04B3/46
摘要:
There is provided a jitter measuring apparatus for measuring jitter in a signal-under-measurement, including a pulse generating section having first pulse generating means for detecting edges of the data-signal-under-measurement to output a first pulse signal having a pulse width set in advance corresponding to the edge and second pulse generating means for detecting boundaries of data sections where data values do not change in the data-signal-under-measurement to output a second pulse signal having a pulse width set in advance over the edge timings of the boundaries of the detected data sections and a jitter calculating section for calculating timing jitter in the data-signal-under-measurement based on the first and second pulse signals.
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