发明授权
- 专利标题: Integrated sample processing devices
- 专利标题(中): 集成样品处理装置
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申请号: US10325723申请日: 2002-12-19
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公开(公告)号: US07507376B2公开(公告)日: 2009-03-24
- 发明人: Joel R. Dufresne , David J. Franta , Christopher R. Kokaisel , Scott M. Lecy
- 申请人: Joel R. Dufresne , David J. Franta , Christopher R. Kokaisel , Scott M. Lecy
- 申请人地址: US MN St. Paul
- 专利权人: 3M Innovative Properties Company
- 当前专利权人: 3M Innovative Properties Company
- 当前专利权人地址: US MN St. Paul
- 主分类号: B01L3/00
- IPC分类号: B01L3/00
摘要:
Sample processing devices may include compression structures that provide for the transfer of force from a platen to a platform such as a thermal block on which the sample processing device is located during processing. The sample processing devices may include a fill reservoir structure with various features such as arcuate edges, radially aligned exit channels, support structures, and selectively variable heights with a corresponding variable volume distribution.
公开/授权文献
- US20040121471A1 Integrated sample processing devices 公开/授权日:2004-06-24
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