发明授权
- 专利标题: Structure and access method for magnetic memory cell and circuit of magnetic memory
- 专利标题(中): 磁存储单元和磁记忆电路的结构和存取方法
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申请号: US11465460申请日: 2006-08-18
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公开(公告)号: US07515458B2公开(公告)日: 2009-04-07
- 发明人: Chien-Chung Hung , Yung-Hsiang Chen , Ming-Jer Kao , Yuan-Jen Lee , Yung-Hung Wang
- 申请人: Chien-Chung Hung , Yung-Hsiang Chen , Ming-Jer Kao , Yuan-Jen Lee , Yung-Hung Wang
- 申请人地址: TW Hsinchu
- 专利权人: Industrial Technology Research Institute
- 当前专利权人: Industrial Technology Research Institute
- 当前专利权人地址: TW Hsinchu
- 代理机构: Jianq Chyun IP Office
- 优先权: TW95113731A 20060418
- 主分类号: G11C11/00
- IPC分类号: G11C11/00
摘要:
A magnetic memory cell, used in a magnetic memory device, includes a stacked magnetic pinned layer, serving as a part of the base structure. The stacked magnetic pinned stacked layer has a top pinned layer and a bottom pinned layer, between which there is a sufficient large magnetic coupling force to maintain magnetization of the top pinned layer on a reference direction. A tunnel barrier layer is disposed on the stacked magnetic pinned layer. A magnetic free stacked layer is disposed on the tunnel barrier layer. The magnetic free stacked layer includes a bottom free layer having a bottom magnetization and a top free layer having a top magnetization. When no assisted magnetic field is applied, the bottom magnetization is anti-parallel to the top magnetization and is perpendicular to the reference direction on the top pinned layer. A magnetic bias layer can be also disposed on the top free layer.
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