Invention Grant
- Patent Title: Submicron particle removal
- Patent Title (中): 亚微米颗粒去除
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Application No.: US11293903Application Date: 2005-12-05
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Publication No.: US07528386B2Publication Date: 2009-05-05
- Inventor: David N. Ruzic , Brian E. Jurczyk , Darren Alman , Martin J. Neumann , Huatan Qiu
- Applicant: David N. Ruzic , Brian E. Jurczyk , Darren Alman , Martin J. Neumann , Huatan Qiu
- Applicant Address: US IL Urbana
- Assignee: Board of Trustees of University of Illinois
- Current Assignee: Board of Trustees of University of Illinois
- Current Assignee Address: US IL Urbana
- Agency: Brinks Hofer Gilson & Lione
- Main IPC: G21G5/00
- IPC: G21G5/00

Abstract:
A system for non-contact cleaning of particulate contamination of surfaces includes one or more sources that create a charge imbalance between a surface and particles that contaminate the surface, and a power supply that creates a pulsed electrical bias on the surface. This imbalance produces an electrostatic force that propels the particles off the surface. The cleaning process can be associated, for example, with microelectronic lithography and manufacturing.
Public/Granted literature
- US20060237667A1 Submicron particle removal Public/Granted day:2006-10-26
Information query
IPC分类:
G | 物理 |
G21 | 核物理;核工程 |
G21G | 化学元素的转变;放射源 |
G21G5/00 | 通过化学反应进行化学元素的推断转变 |