Invention Grant
- Patent Title: Plasma processing method and plasma processing apparatus
- Patent Title (中): 等离子体处理方法和等离子体处理装置
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Application No.: US11066260Application Date: 2005-02-28
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Publication No.: US07541283B2Publication Date: 2009-06-02
- Inventor: Toshihiko Shindo , Shin Okamoto , Kimihiro Higuchi
- Applicant: Toshihiko Shindo , Shin Okamoto , Kimihiro Higuchi
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, P.C.
- Priority: JP2002-256096 20020830
- Main IPC: H01L21/44
- IPC: H01L21/44

Abstract:
A plasma processing method for performing a plasma process on a substrate to be processed by making a plasma act thereon includes the following sequential steps of making a plasma weaker than one used in the plasma process act on the substrate, applying a DC voltage to an electrostatic chuck for attracting and holding the substrate while the weak plasma acts on the substrate, extinguishing the weak plasma, and performing the plasma process. Further, a plasma processing apparatus includes a plasma processing mechanism for performing a plasma process on a substrate to be processed, and a controller for controlling the plasma processing mechanism to thereby perform the plasma processing method.
Public/Granted literature
- US20050142873A1 Plasma processing method and plasma processing apparatus Public/Granted day:2005-06-30
Information query
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