发明授权
- 专利标题: Method and apparatus for testing embedded cores
- 专利标题(中): 嵌入式核心测试方法和装置
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申请号: US11963689申请日: 2007-12-21
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公开(公告)号: US07568141B2公开(公告)日: 2009-07-28
- 发明人: Sankaran M. Menon , Luis A. Basto , Tien Dinh , Thomas Tomazin , Juan G. Revilla
- 申请人: Sankaran M. Menon , Luis A. Basto , Tien Dinh , Thomas Tomazin , Juan G. Revilla
- 申请人地址: US CA Santa Clara US MA Norwood
- 专利权人: Intel Corporation,Analog Devices, Inc.
- 当前专利权人: Intel Corporation,Analog Devices, Inc.
- 当前专利权人地址: US CA Santa Clara US MA Norwood
- 代理机构: Goodwin Procter LLP
- 主分类号: G01R31/28
- IPC分类号: G01R31/28
摘要:
The inputs to an embedded core, e.g., the core terminals, may not be directly connected to pins on the SoC. The lack of direct access to an embedded core's terminals may complicate testing of the embedded core. A test wrapper including boundary scan test (BST) cells may be used to test an embedded core. Dual function BST/ATPG (Automatic Test Pattern Generation) cells may be used to perform both BST and ATPG tests on embedded cores.
公开/授权文献
- US20080104466A1 Method and Apparatus for Testing Embedded Cores 公开/授权日:2008-05-01