Invention Grant
- Patent Title: Wire-bonding method for wire-bonding apparatus
- Patent Title (中): 引线接合装置的接线方法
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Application No.: US11905868Application Date: 2007-10-05
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Publication No.: US07581666B2Publication Date: 2009-09-01
- Inventor: Ho-Ming Tong , Teck-Chong Lee , Chao-Fu Weng , Chian-Chi Lin , Chih-Nan Wei , Song-Fu Yang , Chia-Jung Tsai , Kao-Ming Su
- Applicant: Ho-Ming Tong , Teck-Chong Lee , Chao-Fu Weng , Chian-Chi Lin , Chih-Nan Wei , Song-Fu Yang , Chia-Jung Tsai , Kao-Ming Su
- Applicant Address: TW Kaohsiung
- Assignee: Advanced Semiconductor Engineering, Inc.
- Current Assignee: Advanced Semiconductor Engineering, Inc.
- Current Assignee Address: TW Kaohsiung
- Agency: Bacon & Thomas, PLLC
- Priority: TW95140096A 20061030
- Main IPC: B23K31/12
- IPC: B23K31/12 ; B23K20/00 ; B23K31/00

Abstract:
A wire-bonding method for a wire-bonding apparatus is provided. The wire-bonding apparatus includes at least a first wire-bonder and a second wire-bonder for respectively bonding at least several first chips in a first region and several second chips in a second region on a substrate simultaneously. The wire-bonding method includes following steps. First, initial position coordinates of the first region and the second region are obtained. Next, it is determined whether a space between the first region and the second region is greater than a predetermined space. When the space between the first region and the second region is greater than the predetermined space, the first wire-bonder and the second wire-bonder respectively bond the first chips and the second chips simultaneously.
Public/Granted literature
- US20080102539A1 Wire-bonding method for wire-bonding apparatus Public/Granted day:2008-05-01
Information query
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