Invention Grant
- Patent Title: Monitoring photodetector for integrated photonic devices
- Patent Title (中): 用于集成光子器件的监测光电探测器
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Application No.: US11325325Application Date: 2006-01-05
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Publication No.: US07598527B2Publication Date: 2009-10-06
- Inventor: Alex A. Behfar , Cristian B. Stagarescu , Malcolm R. Green , Alfred T. Schremer, Jr.
- Applicant: Alex A. Behfar , Cristian B. Stagarescu , Malcolm R. Green , Alfred T. Schremer, Jr.
- Applicant Address: US NY Ithaca
- Assignee: Binoptics Corporation
- Current Assignee: Binoptics Corporation
- Current Assignee Address: US NY Ithaca
- Agency: Jones, Tullar & Cooper, P.C.
- Main IPC: H01L29/161
- IPC: H01L29/161

Abstract:
A laser and detector integrated on corresponding epitaxial layers of a single chip cooperate with on-chip and/or external optics to couple light of a first wavelength emitted by the laser to a single external device such as an optical fiber and to simultaneously couple light of a different wavelength received from the external device to the detector to provide bidirectional photonic operation. Multiple lasers and detectors may be integrated on the chip to provide multiple bidirectional channels. A monitoring photodetector is fabricated in the detector epitaxy adjacent one end of the laser.
Public/Granted literature
- US20060118893A1 Monitoring photodetector for integrated photonic devices Public/Granted day:2006-06-08
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