Invention Grant
- Patent Title: Method for removing silicon oxide film and processing apparatus
- Patent Title (中): 去除氧化硅膜的方法和处理装置
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Application No.: US10552262Application Date: 2004-04-20
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Publication No.: US07611995B2Publication Date: 2009-11-03
- Inventor: Kazuhide Hasebe , Mitsuhiro Okada , Takashi Chiba , Jun Ogawa
- Applicant: Kazuhide Hasebe , Mitsuhiro Okada , Takashi Chiba , Jun Ogawa
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Smith, Gambrell & Russell, LLP
- Priority: JP2003-117664 20030422
- International Application: PCT/JP2004/005643 WO 20040420
- International Announcement: WO2004/095559 WO 20041104
- Main IPC: H01L21/302
- IPC: H01L21/302

Abstract:
A silicon dioxide film removing method is capable of removing a silicon dioxide film, such as a natural oxide film or a chemical oxide film, at a temperature considerably higher than a room temperature. The silicon dioxide film removing method of removing a silicon dioxide film formed on a workpiece in a processing vessel 18 that can be evacuated uses a mixed gas containing HF gas and NH3 gas for removing the silicon dioxide film. The silicon dioxide film can be efficiently removed from the surface of the workpiece by using the mixed gas containing HF gas and NH3 gas.
Public/Granted literature
- US20060216941A1 Method for removing silicon oxide film and processing apparatus Public/Granted day:2006-09-28
Information query
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