Invention Grant
US07616313B2 Apparatus and methods for detecting overlay errors using scatterometry
有权
使用散射法检测重叠误差的装置和方法
- Patent Title: Apparatus and methods for detecting overlay errors using scatterometry
- Patent Title (中): 使用散射法检测重叠误差的装置和方法
-
Application No.: US11525320Application Date: 2006-09-21
-
Publication No.: US07616313B2Publication Date: 2009-11-10
- Inventor: Daniel Kandel , Walter D. Mieher , Boris Golovanevsky
- Applicant: Daniel Kandel , Walter D. Mieher , Boris Golovanevsky
- Applicant Address: US CA Milpitas
- Assignee: KLA-Tencor Technologies Corporation
- Current Assignee: KLA-Tencor Technologies Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Suiter Swantz pc llo
- Main IPC: G01B11/00
- IPC: G01B11/00

Abstract:
Embodiments of the invention include a scatterometry target for use in determining the alignment between substrate layers. A target arrangement is formed on a substrate and comprises a plurality of target cells. Each cell has two layers of periodic features constructed such that an upper layer is arranged above a lower layer and configured so that the periodic features of the upper layer have an offset and/or different pitch than periodic features of the lower layer. The pitches are arranged to generate a periodic signal when the target is exposed to an illumination source. The target also includes disambiguation features arranged between the cells and configured to resolve ambiguities caused by the periodic signals generated by the cells when exposed to the illumination source.
Public/Granted literature
- US20070229829A1 Apparatus and methods for detecting overlay errors using scatterometry Public/Granted day:2007-10-04
Information query