Invention Grant
- Patent Title: Integrated probe module for LCD panel light inspection
- Patent Title (中): 集成探头模块,用于LCD面板灯检测
-
Application No.: US10689262Application Date: 2003-10-20
-
Publication No.: US07619429B2Publication Date: 2009-11-17
- Inventor: Min-Chieh Chou , Jiu-Shu Tasi , Horng-Jee Wang , Ya-Ju Huang , Kun-Chih Pan , Chih-Wei Chen , Jyh-Chun Chang
- Applicant: Min-Chieh Chou , Jiu-Shu Tasi , Horng-Jee Wang , Ya-Ju Huang , Kun-Chih Pan , Chih-Wei Chen , Jyh-Chun Chang
- Applicant Address: TW Hsinchu
- Assignee: Industrial Technology Research Institute
- Current Assignee: Industrial Technology Research Institute
- Current Assignee Address: TW Hsinchu
- Agency: Quintero Law Office
- Main IPC: G01R31/02
- IPC: G01R31/02

Abstract:
A probe module which is particularly suitable for testing an LCD panel. The probe module includes a probe base, a plurality of probe pins provided on the probe base, and a high-density circuit interconnection which includes a flexible circuit board that connects the probe pins to a testing apparatus. The tip of each probe pin may have a pointed or tapered configuration, or alternatively, a hemi-spherical configuration.
Public/Granted literature
- US20050083074A1 Integrated probe module for LCD panel light inspection Public/Granted day:2005-04-21
Information query