发明授权
US07629211B2 Field effect transistor and method of forming a field effect transistor
有权
场效应晶体管和形成场效应晶体管的方法
- 专利标题: Field effect transistor and method of forming a field effect transistor
- 专利标题(中): 场效应晶体管和形成场效应晶体管的方法
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申请号: US11684211申请日: 2007-03-09
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公开(公告)号: US07629211B2公开(公告)日: 2009-12-08
- 发明人: Sven Beyer , Thorsten Kammler , Rolf Stephan , Manfred Horstmann
- 申请人: Sven Beyer , Thorsten Kammler , Rolf Stephan , Manfred Horstmann
- 申请人地址: US TX Austin
- 专利权人: Advanced Micro Devices, Inc.
- 当前专利权人: Advanced Micro Devices, Inc.
- 当前专利权人地址: US TX Austin
- 代理机构: Williams, Morgan & Amerson, P.C.
- 优先权: DE102006035665 20060731
- 主分类号: H01L21/331
- IPC分类号: H01L21/331 ; H01L21/8234
摘要:
A method of forming a field effect transistor comprises providing a semiconductor substrate, a gate electrode being formed over the semiconductor substrate. At least one cavity is formed adjacent the gate electrode. A strain-creating element is formed in the at least one cavity. The strain-creating element comprises a compound material comprising a first chemical element and a second chemical element. A first concentration ratio between a concentration of the first chemical element in a first portion of the strain-creating element and a concentration of the second chemical element in the first portion of the strain-creating element is different from a second concentration ratio between a concentration of the first chemical element in a second portion of the strain-creating element and a concentration of the second chemical element in the second strain-creating element.
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