发明授权
- 专利标题： Efficient storage of fail data to aid in fault isolation
- 专利标题（中）： 故障数据的有效存储有助于故障隔离
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申请号： US10884333申请日： 2004-07-01
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公开(公告)号： US07634127B1公开(公告)日： 2009-12-15
- 发明人: Srikanth Sundararajan , Siu May Ho , Shivananda S. Shetty
- 申请人： Srikanth Sundararajan , Siu May Ho , Shivananda S. Shetty
- 申请人地址： US CA Sunnyvale
- 专利权人： Advanced Micro Devices, Inc.
- 当前专利权人： Advanced Micro Devices, Inc.
- 当前专利权人地址： US CA Sunnyvale
- 代理机构： Farjami & Farjami LLP
- 主分类号： G06K9/00
- IPC分类号： G06K9/00 ; G01R31/26
摘要：
A method and system for fault isolation in semiconductor with devices thereon includes determining test data from a plurality of semiconductor devices and creating a failure bitmap of locations of the plurality of semiconductor devices and test data in a vector graphic CAD format. The vector graphic CAD format allows storage of test data on multiple layers.
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