发明授权
- 专利标题: Interferometer system for monitoring an object
- 专利标题(中): 用于监测物体的干涉仪系统
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申请号: US11656597申请日: 2007-01-23
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公开(公告)号: US07636166B2公开(公告)日: 2009-12-22
- 发明人: Peter De Groot , Leslie L. Deck , Carl Zanoni
- 申请人: Peter De Groot , Leslie L. Deck , Carl Zanoni
- 申请人地址: US CT Middlefield
- 专利权人: Zygo Corporation
- 当前专利权人: Zygo Corporation
- 当前专利权人地址: US CT Middlefield
- 代理机构: Fish & Richardson P.C.
- 主分类号: G01B11/02
- IPC分类号: G01B11/02
摘要:
In general, in one aspect, the invention features a system that includes a first object mounted relative to a second object, the first object being moveable with respect to the second object. The system includes a plurality of interferometers each configured to derive a first wavefront and a second wavefront from input radiation and to combine the first and second wavefronts to provide output radiation including information about an optical path length difference between the paths of the first and second wavefronts, each interferometer including a reflective element positioned in the path of the first wavefront, and at least one of the interferometer's reflective element is mounted on the first object. The system also includes a plurality of fiber waveguides and an electronic controller. Each fiber waveguide is configured to deliver the input radiation to a corresponding interferometer or deliver the output radiation from the corresponding interferometer to a corresponding detector. The electronic controller is configured to monitor a degree of freedom of the first object relative to the second object based on the information from at least one of the interferometers, wherein the degree of freedom is an absolute displacement between the first and second objects.
公开/授权文献
- US20070171425A1 Interferometer system for monitoring an object 公开/授权日:2007-07-26
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