发明授权
- 专利标题: Semiconductor structures and method for fabricating the same
- 专利标题(中): 半导体结构及其制造方法
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申请号: US11949081申请日: 2007-12-03
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公开(公告)号: US07651876B2公开(公告)日: 2010-01-26
- 发明人: Kuo-Lung Fang , Chih-Chun Yang , Han-Tu Lin
- 申请人: Kuo-Lung Fang , Chih-Chun Yang , Han-Tu Lin
- 申请人地址: TW Hsinchu
- 专利权人: AU Optronics Corp.
- 当前专利权人: AU Optronics Corp.
- 当前专利权人地址: TW Hsinchu
- 代理机构: Thomas, Kayden, Horstemeyer & Risley
- 优先权: TW96106093A 20070216
- 主分类号: H01L21/00
- IPC分类号: H01L21/00 ; H01L21/84 ; H01L21/44
摘要:
A semiconductor structure is provided. The semiconductor structure includes a substrate, a gate disposed thereon, an insulation layer disposed on the substrate and overlying the gate, a patterned semiconductor layer disposed on the insulation layer, a source and a drain disposed on the patterned semiconductor layer, a protective layer overlying the insulation layer, the source and the boundary of the drain to expose a portion of the drain, and a pixel electrode disposed on the substrate, overlying the protective layer overlying the boundary of the drain, electrically connected to the exposed drain.
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