发明授权
- 专利标题: Distortion detector
- 专利标题(中): 失真检测器
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申请号: US11663284申请日: 2005-09-30
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公开(公告)号: US07658118B2公开(公告)日: 2010-02-09
- 发明人: Sigehiro Yosiuti , Shusaku Kawasaki , Hiroaki Mori , Yasunori Matsukawa , Yasunobu Kobayashi
- 申请人: Sigehiro Yosiuti , Shusaku Kawasaki , Hiroaki Mori , Yasunori Matsukawa , Yasunobu Kobayashi
- 申请人地址: JP Osaka
- 专利权人: Panasonic Corporation
- 当前专利权人: Panasonic Corporation
- 当前专利权人地址: JP Osaka
- 代理机构: Wenderoth, Lind & Ponack, L.L.P.
- 优先权: JP2004-292224 20041005
- 国际申请: PCT/JP2005/018110 WO 20050930
- 国际公布: WO2006/038553 WO 20060413
- 主分类号: G01L1/22
- IPC分类号: G01L1/22 ; G01B7/16
摘要:
A strain detector includes a bridge circuit having at least two strain resistance elements, a substrate, a first fixed member, and a second fixed member. The substrate has a circuit portion electrically connected to the strain resistance elements. The strain resistance elements are arranged on the substrate. The first fixed member is fixed to a center of an area, where an outer periphery of the area is set at a position at which the strain resistance elements are arranged. The second fixed member is fixed outside the position, where the strain resistance elements are arranged at the substrate. A center of an axis of the first fixed member, a center of an axis of the second fixed member, and the center of the area are positioned on a straight line, and the first fixed member and the second fixed member are arranged on two mutually opposed surfaces of the substrate.
公开/授权文献
- US20080245157A1 Distortion Detector 公开/授权日:2008-10-09
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