发明授权
US07660175B2 Integrated circuit, method for acquiring data and measurement system
有权
集成电路,采集数据和测量系统的方法
- 专利标题: Integrated circuit, method for acquiring data and measurement system
- 专利标题(中): 集成电路,采集数据和测量系统的方法
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申请号: US12040719申请日: 2008-02-29
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公开(公告)号: US07660175B2公开(公告)日: 2010-02-09
- 发明人: Dieter Kohlert , Erhard Sixt , Rainer Holmer , Georg Seidemann , Berthold Schuderer , Gunther Mackh , Sabine Penka , Grit Schwalbe-Dietrich , Bernhard Duschinger , Josef Hermann
- 申请人: Dieter Kohlert , Erhard Sixt , Rainer Holmer , Georg Seidemann , Berthold Schuderer , Gunther Mackh , Sabine Penka , Grit Schwalbe-Dietrich , Bernhard Duschinger , Josef Hermann
- 申请人地址: DE Neubiberg
- 专利权人: Infineon Technologies AG
- 当前专利权人: Infineon Technologies AG
- 当前专利权人地址: DE Neubiberg
- 代理机构: Slater & Matsil, L.L.P.
- 主分类号: G11C7/00
- IPC分类号: G11C7/00
摘要:
An embodiment of an integrated circuit comprises a plurality of cells. Each cell comprises a first supply node, a second supply node, a series connection with a first transistor, a second transistor and an electrical element. The series connection is coupled between the first and the second supply node. The electrical element includes a first and a second node. A third transistor is coupled between the first node of the electrical element and a first output node of the cell and a fourth transistor is coupled between the second node of the electrical element and the second output node of the cell. A control terminal of the first, the third and the fourth transistor is coupled to a first control node of the cell and a control terminal of the second transistor is coupled to a second control node of the cell.