Metallization for Chip Scale Packages in Wafer Level Packaging
    6.
    发明申请
    Metallization for Chip Scale Packages in Wafer Level Packaging 有权
    晶圆级封装芯片尺寸封装的金属化

    公开(公告)号:US20120034760A1

    公开(公告)日:2012-02-09

    申请号:US12851292

    申请日:2010-08-05

    IPC分类号: H01L21/78

    CPC分类号: H01L21/78 H01L2224/02371

    摘要: In one embodiment, a method for forming the semiconductor device includes forming a first trench from a front side of a substrate. The substrate has a front side and an opposite back side, and the first trench having sidewalls and a bottom surface. A insulator layer is formed over the sidewalls and the bottom surface. A first conductive layer is formed over a top portion of the sidewalls of the first trench. The substrate is separated along the first trench.

    摘要翻译: 在一个实施例中,用于形成半导体器件的方法包括从衬底的前侧形成第一沟槽。 衬底具有前侧和相对的后侧,并且第一沟槽具有侧壁和底表面。 在侧壁和底表面上形成绝缘体层。 第一导电层形成在第一沟槽的侧壁的顶部上方。 衬底沿着第一沟槽分离。

    Metallization for chip scale packages in wafer level packaging
    9.
    发明授权
    Metallization for chip scale packages in wafer level packaging 有权
    晶圆级封装中芯片级封装的金属化

    公开(公告)号:US08163629B2

    公开(公告)日:2012-04-24

    申请号:US12851292

    申请日:2010-08-05

    IPC分类号: H01L21/301

    CPC分类号: H01L21/78 H01L2224/02371

    摘要: In one embodiment, a method for forming the semiconductor device includes forming a first trench from a front side of a substrate. The substrate has a front side and an opposite back side, and the first trench having sidewalls and a bottom surface. A insulator layer is formed over the sidewalls and the bottom surface. A first conductive layer is formed over a top portion of the sidewalls of the first trench. The substrate is separated along the first trench.

    摘要翻译: 在一个实施例中,用于形成半导体器件的方法包括从衬底的前侧形成第一沟槽。 衬底具有前侧和相对的后侧,并且第一沟槽具有侧壁和底表面。 在侧壁和底表面上形成绝缘体层。 第一导电层形成在第一沟槽的侧壁的顶部上方。 衬底沿着第一沟槽分离。