METHOD FOR PRODUCING A SEMICONDUCTOR WAFER WITH REAR SIDE IDENTIFICATION
    3.
    发明申请
    METHOD FOR PRODUCING A SEMICONDUCTOR WAFER WITH REAR SIDE IDENTIFICATION 有权
    用于生产具有后面识别的半导体波形的方法

    公开(公告)号:US20110147471A1

    公开(公告)日:2011-06-23

    申请号:US13036669

    申请日:2011-02-28

    IPC分类号: G06K19/06 H01L21/44

    摘要: A semiconductor wafer with rear side identification and to a method for producing the same is disclosed. In one embodiment, the rear side identification has a multiplicity of information regarding the monocrystalline and surface and also rear side constitution. A multiplicity of semiconductor device positions arranged in rows and columns are provided on the top side of the semiconductor wafer, an information chip being arranged at an exposed semiconductor device position, the information chip having at least the information of the rear side identification.

    摘要翻译: 公开了具有背面识别的半导体晶片及其制造方法。 在一个实施例中,后侧识别具有关于单晶和表面以及后侧结构的多个信息。 在半导体晶片的顶侧设置有以行和列排列的多个半导体器件位置,信息芯片布置在暴露的半导体器件位置,信息芯片至少具有背面识别信息。

    Method for producing a semiconductor wafer with rear side identification
    4.
    发明授权
    Method for producing a semiconductor wafer with rear side identification 有权
    用于制造具有背面识别的半导体晶片的方法

    公开(公告)号:US08173534B2

    公开(公告)日:2012-05-08

    申请号:US13036669

    申请日:2011-02-28

    IPC分类号: H01L21/44

    摘要: A semiconductor wafer with rear side identification and to a method for producing the same is disclosed. In one embodiment, the rear side identification has a multiplicity of information regarding the monocrystalline and surface and also rear side constitution. A multiplicity of semiconductor device positions arranged in rows and columns are provided on the top side of the semiconductor wafer, an information chip being arranged at an exposed semiconductor device position, the information chip having at least the information of the rear side identification.

    摘要翻译: 公开了具有背面识别的半导体晶片及其制造方法。 在一个实施例中,后侧识别具有关于单晶和表面以及后侧结构的多个信息。 在半导体晶片的顶侧设置有以行和列排列的多个半导体器件位置,信息芯片布置在暴露的半导体器件位置,信息芯片至少具有背面识别信息。

    SEMICONDUCTOR WAFER WITH REAR SIDE IDENTIFICATION AND METHOD
    5.
    发明申请
    SEMICONDUCTOR WAFER WITH REAR SIDE IDENTIFICATION AND METHOD 有权
    具有后面识别和方法的半导体波形

    公开(公告)号:US20070178612A1

    公开(公告)日:2007-08-02

    申请号:US11622290

    申请日:2007-01-11

    IPC分类号: H01L21/66

    摘要: A semiconductor wafer with rear side identification and to a method for producing the same is disclosed. In one embodiment, the rear side identification has a multiplicity of information regarding the monocrystalline and surface and also rear side constitution. A multiplicity of semiconductor device positions arranged in rows and columns are provided on the top side of the semiconductor wafer, an information chip being arranged at an exposed semiconductor device position, the information chip having at least the information of the rear side identification.

    摘要翻译: 公开了具有背面识别的半导体晶片及其制造方法。 在一个实施例中,后侧识别具有关于单晶和表面以及后侧结构的多个信息。 在半导体晶片的顶侧设置有以行和列排列的多个半导体器件位置,信息芯片布置在暴露的半导体器件位置,信息芯片至少具有背面识别信息。

    Semiconductor wafer with rear side identification and method
    6.
    发明授权
    Semiconductor wafer with rear side identification and method 有权
    具有背面识别和半导体晶圆的方法

    公开(公告)号:US07911036B2

    公开(公告)日:2011-03-22

    申请号:US11622290

    申请日:2007-01-11

    IPC分类号: H01L29/06

    摘要: A semiconductor wafer with rear side identification and to a method for producing the same is disclosed. In one embodiment, the rear side identification has a multiplicity of information regarding the monocrystalline and surface and also rear side constitution. A multiplicity of semiconductor device positions arranged in rows and columns are provided on the top side of the semiconductor wafer, an information chip being arranged at an exposed semiconductor device position, the information chip having at least the information of the rear side identification.

    摘要翻译: 公开了具有背面识别的半导体晶片及其制造方法。 在一个实施例中,后侧识别具有关于单晶和表面以及后侧结构的多个信息。 在半导体晶片的顶侧设置有以行和列排列的多个半导体器件位置,信息芯片布置在暴露的半导体器件位置,信息芯片至少具有背面识别信息。