Invention Grant
- Patent Title: Method and arrangement for contacting terminals
- Patent Title (中): 接线端子的方法和装置
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Application No.: US11985686Application Date: 2007-11-16
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Publication No.: US07666783B2Publication Date: 2010-02-23
- Inventor: Klaus Goller , Alexander Reb , Grit Schwalbe
- Applicant: Klaus Goller , Alexander Reb , Grit Schwalbe
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Maginiot, Moore & Beck
- Priority: DE10305365 20030210
- Main IPC: H01L21/4763
- IPC: H01L21/4763

Abstract:
In a method of contacting terminals, a substrate having a first terminal and a second terminal is provided, a terminal surface of the first terminal being located at a shorter distance from a substrate surface than a surface of the second terminal. A first insulating layer, in which a contact via is formed for exposing the terminal surface of the first terminal, is formed on the substrate surface. The contact via is filled with a conductive material, and a second insulating layer is formed on the first insulating layer and on the contact via filled with the conductive material. Using an etching mask, a first recess for exposing the conductive material filling the contact via, and a second recess are etched through the second and first insulating layers for exposing the second terminal surface. A conductive material for producing first and second contact terminals is introduced into the first and second recesses. This is to achieve that the second terminal is contacted in the production of the second contact terminal.
Public/Granted literature
- US20080070403A1 Method and arrangement for contacting terminals Public/Granted day:2008-03-20
Information query
IPC分类: