Invention Grant
- Patent Title: Apparatus configured to position a workpiece
- Patent Title (中): 被配置为定位工件的装置
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Application No.: US12068071Application Date: 2008-02-01
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Publication No.: US07679720B2Publication Date: 2010-03-16
- Inventor: Michel Pieter Dansberg , Sebastiaan Maria Johannes Cornelissen , Henrikus Herman Marie Cox , Robert Johannes Petrus Van Diesen , Nicolaas Rudolf Kemper , Robert-Han Munnig-Schmidt , Harmen Klaas Van der Schoot , Rob Jansen
- Applicant: Michel Pieter Dansberg , Sebastiaan Maria Johannes Cornelissen , Henrikus Herman Marie Cox , Robert Johannes Petrus Van Diesen , Nicolaas Rudolf Kemper , Robert-Han Munnig-Schmidt , Harmen Klaas Van der Schoot , Rob Jansen
- Applicant Address: NL Veldhoven
- Assignee: ASML Netherlands B.V.
- Current Assignee: ASML Netherlands B.V.
- Current Assignee Address: NL Veldhoven
- Agency: Sterne, Kessler, Goldstein & Fox P.L.L.C.
- Priority: EP03077701 20030829
- Main IPC: G03B27/42
- IPC: G03B27/42 ; G03B27/58 ; G03B27/62 ; H02K41/00

Abstract:
An apparatus is configured to position a workpiece. The apparatus includes a planar base, and a movable stage configured to support the workpiece. The stage is configured to be moved over the planar base. The apparatus also includes an actuator configured to move the stage, a contactless position measurer configured to measure a position of the stage, and a first pump configured to generate a conditioned gas flow in a volume between the measurer and the stage. The base includes a plurality of gas channels provided in the base that provide a path of the conditioned gas flow through the base.
Public/Granted literature
- US20080174750A1 Apparatus configured to position a workpiece Public/Granted day:2008-07-24
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