Invention Grant
- Patent Title: Self-centering nest for electronics testing
- Patent Title (中): 用于电子测试的自定心巢
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Application No.: US11627661Application Date: 2007-01-26
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Publication No.: US07696770B2Publication Date: 2010-04-13
- Inventor: Francois Binette , Jerome Bougie , Andre Chouinard
- Applicant: Francois Binette , Jerome Bougie , Andre Chouinard
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corportion
- Current Assignee: International Business Machines Corportion
- Current Assignee Address: US NY Armonk
- Agency: Cantor Colburn LLP
- Agent Yuanmin Cai
- Main IPC: G01R31/26
- IPC: G01R31/26 ; G01R31/02
Abstract:
The shortcomings of the prior art are overcome and additional advantages are provided through the provision of a self-centering nest for testing of microprocessor chip modules. The self-centering nest includes two slideable jaws disposed on a base diagonally opposite each other. Each jaw includes a jaw pin that is receptive in a carrier, such that when the jaw pins are received in the carrier, the jaws are in an open position. The self-centering nest includes a transfer mechanism for urging a microprocessor chip module from the carrier into the self-centering nest. The self-centering nest includes a plurality of springs, each spring having a first end connected to the first slideable jaw and a second end connected to the second slideable jaw. The springs cause the jaws to move toward each other capturing and centering the microprocessor chip module when the jaws are pulled away from the carrier releasing the jaw pins.
Public/Granted literature
- US20080180128A1 SELF-CENTERING NEST FOR ELECTRONICS TESTING Public/Granted day:2008-07-31
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