发明授权
- 专利标题: Method and apparatus for surface desorption ionization by charged particles
- 专利标题(中): 带电粒子表面解吸电离的方法和装置
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申请号: US11398305申请日: 2006-04-04
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公开(公告)号: US07723678B2公开(公告)日: 2010-05-25
- 发明人: Jean-Luc Truche , Paul C. Goodley , Gregor Overney
- 申请人: Jean-Luc Truche , Paul C. Goodley , Gregor Overney
- 申请人地址: US CA Santa Clara
- 专利权人: Agilent Technologies, Inc.
- 当前专利权人: Agilent Technologies, Inc.
- 当前专利权人地址: US CA Santa Clara
- 主分类号: H01J49/14
- IPC分类号: H01J49/14
摘要:
An apparatus and method for generating analyte ions from a sample. An ion generating device is provided having a chamber with an outlet and a surface having a material and means for applying a high velocity gas flow through the chamber toward the outlet such that charged particles are produced by physical interaction between the high velocity gas and the material. The charged particles then induce the generation of primary ions by interaction with molecules of the high velocity gas. The primary ions are emitted from the outlet of the ion generating device toward a sample-bearing surface and analyte ions are generated by impact of the primary ions on the analyte sample on the surface.
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