发明授权
- 专利标题: Linear RF ion trap with high mass resolution
- 专利标题(中): 具有高质量分辨率的线性RF离子阱
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申请号: US11955581申请日: 2007-12-13
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公开(公告)号: US07737398B2公开(公告)日: 2010-06-15
- 发明人: Karsten Michelmann
- 申请人: Karsten Michelmann
- 申请人地址: DE Bremen
- 专利权人: Bruker Daltonik GmbH
- 当前专利权人: Bruker Daltonik GmbH
- 当前专利权人地址: DE Bremen
- 代理机构: O'Shea Getz P.C.
- 优先权: DE102006059697 20061218
- 主分类号: H01J49/42
- IPC分类号: H01J49/42 ; H01J49/00
摘要:
In a linear ion trap in which an essentially quadrupole RF electrical field is generated between at least four rod-shaped electrodes, ions may be mass-selectively ejected orthogonally to the axis. An aspect of the invention comprises compensating for field irregularities along the axis of a linear ion trap, which result, at different ejection locations, in the ejection of ions of the same masses at slightly different times, by of measuring the ions that are ejected at the different ejection locations using a number of separate detectors, and correcting, after a mass calibration of each of the mass spectra, the time shifts of the various location-dependent mass spectra during their addition to a combined spectrum.
公开/授权文献
- US20080142706A1 LINEAR RF ION TRAP WITH HIGH MASS RESOLUTION 公开/授权日:2008-06-19
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