Invention Grant
- Patent Title: Self-calibration systems and methods
- Patent Title (中): 自校准系统和方法
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Application No.: US11475684Application Date: 2006-06-27
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Publication No.: US07756663B2Publication Date: 2010-07-13
- Inventor: Dong Hoon Han , Abhijit Chatterjee , Selim Sermet Akbay , Soumendu Bhattacharya , William R. Eisenstadt
- Applicant: Dong Hoon Han , Abhijit Chatterjee , Selim Sermet Akbay , Soumendu Bhattacharya , William R. Eisenstadt
- Applicant Address: US GA Atlanta US FL Gainesville
- Assignee: Georgia Tech Research Corporation,University of Florida Research Foundation
- Current Assignee: Georgia Tech Research Corporation,University of Florida Research Foundation
- Current Assignee Address: US GA Atlanta US FL Gainesville
- Agency: Thomas, Kayden, Horstemeyer & Risley, LLP
- Main IPC: G01R35/00
- IPC: G01R35/00 ; G01D18/00 ; G01P21/00

Abstract:
Various embodiments of self-calibration systems and methods are described. One method embodiment, among others, includes imposing an alternate test to components within the device, responsive to the imposition of the alternate test, providing test responses corresponding to the components, and substantially, simultaneously mapping each of the test responses to corresponding specification values of the components.
Public/Granted literature
- US20100145651A1 SELF-CALIBRATION SYSTEMS AND METHODS Public/Granted day:2010-06-10
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