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公开(公告)号：US07925229B2
公开(公告)日：2011-04-12
申请号：US12109915
申请日：2008-04-25
申请人： William R. Eisenstadt , Robert M. Fox , Jang Sup Yoon , Tao Zhang
发明人： William R. Eisenstadt , Robert M. Fox , Jang Sup Yoon , Tao Zhang
CPC分类号： H03F3/50 , H03F3/24 , H03F3/72 , H03F2200/105 , H03F2203/5031 , H04B17/19 , H04B17/318 , H04B2001/0408
摘要： A self-testing transceiver having an on-chip power detection capability is provided. The self-testing transceiver can include a semiconductor substrate and a transmitter having a high-power amplifier disposed on the substrate. The self-testing transceiver also can include a receiver disposed on the substrate for selectively coupling to an antenna. The self-testing transceiver can further include at least one power detector disposed on the semiconductor substrate for determining a power such as an RMS and/or peak-power of a signal at an internal node of the self-testing transceiver. Additionally, the self-testing transceiver can include a loopback circuit disposed on the substrate.
摘要翻译： 提供具有片上功率检测能力的自检收发器。 自检收发器可以包括半导体衬底和具有设置在衬底上的高功率放大器的发射器。 自检收发器还可以包括布置在衬底上的接收器，用于选择性地耦合到天线。 所述自检收发器还可以包括设置在所述半导体衬底上的至少一个功率检测器，用于确定所述自检收发器的内部节点处的信号的RMS和/或峰值功率的功率。 此外，自检收发器可以包括设置在基板上的环回电路。
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公开(公告)号：US20080309321A1
公开(公告)日：2008-12-18
申请号：US11996257
申请日：2006-07-19
IPC分类号： G01R31/28
CPC分类号： G01R21/01
摘要： A distributed RF/microwave power detector for detecting the power of a signal is provided. The distributed RF/microwave power detector includes a power detector on or at least partially embedded in a single substrate. The distributed RF/microwave power detector includes a detection unit that has a distributed amplifier for amplifying the signal and outputting an amplified signal, and a detector for detecting the power of the amplified signal. The distributed RF/microwave power detector further includes at least one additional detection unit cascaded with the first. The additional detection unit includes an additional distributed amplifier for amplifying the amplified signal and outputting a further amplified signal, as well as an additional detector for detecting a power of the further amplified signal. The distributed RF/microwave power detector also includes a multiplexer for multiplexing outputs of the detector and at least one additional detector, each having a dynamic range different from the other.
摘要翻译： 提供了用于检测信号功率的分布式RF /微波功率检测器。 分布式RF /微波功率检测器包括在至少部分地嵌入单个衬底中或至少部分地嵌入在单个衬底中的功率检测器。 分布式RF /微波功率检测器包括具有用于放大信号并输出放大信号的分布式放大器的检测单元和用于检测放大信号功率的检测器。 分布式RF /微波功率检测器还包括与第一级联的至少一个额外的检测单元。 附加检测单元包括用于放大放大信号并输出进一步放大的信号的附加分布式放大器，以及用于检测另外的放大信号的功率的附加检测器。 分布式RF /微波功率检测器还包括多路复用器，用于复用检测器和至少一个附加检测器的输出，每个检测器具有不同于另一个的动态范围。
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公开(公告)号：US5793213A
公开(公告)日：1998-08-11
申请号：US691085
申请日：1996-08-01
CPC分类号： G01R35/005 , G01R27/28
摘要： A calibration standard (204) provides interconnection between measurement ports (212, 214, 216) of a network analyzer (202) having at least three measurement ports. Once the measurement ports (212, 214, 216) of the network analyzer (202) are interconnected, a non-zero signal transfer is generated between each of the measurement ports and at least one other measurement port as part of the calibration process. Interconnecting all of the measurement ports (212, 214, 216) together and generating non-zero signal transfers characterizes the relative relationship between the ports during the calibration process. The calibration standard (204) can also provide a desired level of mode conversion.
摘要翻译： 校准标准（204）提供具有至少三个测量端口的网络分析器（202）的测量端口（212,214,216）之间的互连。 一旦网络分析器（202）的测量端口（212,214,216）互连，则在每个测量端口和至少一个其它测量端口之间产生非零信号传输，作为校准过程的一部分。 将所有测量端口（212,214,216）互连在一起并产生非零信号传输表征了在校准过程期间端口之间的相对关系。 校准标准（204）还可以提供期望的模式转换水平。
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公开(公告)号：US5495173A
公开(公告)日：1996-02-27
申请号：US270356
申请日：1994-07-05
IPC分类号： G01R1/067 , G01R27/28 , G01R31/3167 , G01R27/04
CPC分类号： G01R31/3167 , G01R1/06772 , G01R27/28
摘要： A method and apparatus is provided for characterizing a differential circuit. A measurement system (200) is used to introduce input signals to the differential circuit and to measure corresponding output signals. Particularly, an input differential wave is introduced into the differential circuit (1010) while correspondingly measuring a differential output wave (1020) and a first common mode output wave (1030). Similarly, an input common mode wave is introduced (1040) while measuring a second differential output wave (1050) and a second common mode output wave (1060).
摘要翻译： 提供了用于表征差分电路的方法和装置。 测量系统（200）用于将输入信号引入差分电路并测量对应的输出信号。 特别地，输入差分波被引入差分电路（1010），同时相应地测量差分输出波（1020）和第一共模输出波（1030）。 类似地，在测量第二差分输出波（1050）和第二共模输出波（1060）的同时引入输入共模波（1040）。
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公开(公告)号：US07839137B2
公开(公告)日：2010-11-23
申请号：US11996257
申请日：2006-07-19
CPC分类号： G01R21/01
摘要： A distributed RF/microwave power detector for detecting the power of a signal is provided. The distributed RF/microwave power detector includes a power detector on or at least partially embedded in a single substrate. The distributed RF/microwave power detector includes a detection unit that has a distributed amplifier for amplifying the signal and outputting an amplified signal, and a detector for detecting the power of the amplified signal. The distributed RF/microwave power detector further includes at least one additional detection unit cascaded with the first. The additional detection unit includes an additional distributed amplifier for amplifying the amplified signal and outputting a further amplified signal, as well as an additional detector for detecting a power of the further amplified signal. The distributed RF/microwave power detector also includes a multiplexer for multiplexing outputs of the detector and at least one additional detector, each having a dynamic range different from the other.
摘要翻译： 提供了用于检测信号功率的分布式RF /微波功率检测器。 分布式RF /微波功率检测器包括在至少部分地嵌入单个衬底中或至少部分地嵌入在单个衬底中的功率检测器。 分布式RF /微波功率检测器包括具有用于放大信号并输出放大信号的分布式放大器的检测单元和用于检测放大信号功率的检测器。 分布式RF /微波功率检测器还包括与第一级联的至少一个额外的检测单元。 附加检测单元包括用于放大放大信号并输出进一步放大的信号的附加分布式放大器，以及用于检测另外的放大信号的功率的附加检测器。 分布式RF /微波功率检测器还包括多路复用器，用于复用检测器和至少一个附加检测器的输出，每个检测器具有不同于另一个的动态范围。
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公开(公告)号：US20100145651A1
公开(公告)日：2010-06-10
申请号：US11475684
申请日：2006-06-27
申请人： Dong Hoon Han , Abhijit Chatterjee , Selim Sermet Akbay , Soumendu Bhattacharya , William R. Eisenstadt
发明人： Dong Hoon Han , Abhijit Chatterjee , Selim Sermet Akbay , Soumendu Bhattacharya , William R. Eisenstadt
IPC分类号： G01R35/00
CPC分类号： H04B17/21
摘要： Various embodiments of self-calibration systems and methods are described. One method embodiment, among others, includes imposing an alternate test to components within the device, responsive to the imposition of the alternate test, providing test responses corresponding to the components, and substantially, simultaneously mapping each of the test responses to corresponding specification values of the components.
摘要翻译： 描述了自校准系统和方法的各种实施例。 一个方法实施例包括对设备内的组件施加替代测试，响应于施加替代测试，提供对应于组件的测试响应，并且基本上同时将每个测试响应映射到相应的规范值 组件。
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公开(公告)号：US5561378A
公开(公告)日：1996-10-01
申请号：US270359
申请日：1994-07-05
IPC分类号： G01R1/067 , G01R31/28 , G01R31/317 , G01R31/319 , H01P3/08 , G01R1/06
CPC分类号： G01R31/2822 , G01R1/06772 , G01R31/2851 , G01R31/31716 , G01R31/31926 , H01P3/08
摘要： A circuit probe (300) is provided for measuring a differential circuit. The circuit probe (300) incorporates a novel transmission line (325) which is formed to propagate signals with substantially equal even-mode and odd-mode characteristic impedances. The circuit probe (300) further includes signal contacts (314, 316) and ground contacts (312, 318) coupled to signal conductors (334, 336) and ground conductors (332, 338), respectively, of the transmission line (325).
摘要翻译： 提供电路探针（300）用于测量差分电路。 电路探头（300）包括新颖的传输线（325），其被形成为传播具有基本相等的偶模和奇模特性阻抗的信号。 电路探针（300）还包括分别耦合到传输线（325）的信号导体（334,336）和接地导体（332,338）的信号触头（314,316）和接地触头（312,318） 。
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公开(公告)号：US5501877A
公开(公告)日：1996-03-26
申请号：US308156
申请日：1994-09-19
摘要： A method for creating a patterned thin film of a high surface energy material on a substrate comprising the steps of creating a photomask pattern on the substrate using photolithography, providing an oppositely charged surface on the substrate and photomask, if such does not exist, from that of particles of the high surface energy material, removing the photomask and exposing the substrate to an aqueous colloidal suspension of particles composed of the high surface energy material to adsorb seed particles onto the surface of the substrate, or removing the photomask after adsorbing seed particles to the surface, and then depositing a uniform thin film of the high surface energy material by chemical vapor deposition onto the seeded substrate.
摘要翻译： 一种用于在衬底上形成高表面能材料的图案化薄膜的方法，包括以下步骤：使用光刻法在衬底上产生光掩模图案，在衬底上提供相反电荷的表面和光掩模（如果不存在） 的高表面能材料的颗粒，去除光掩模，并将基底暴露于由高表面能材料构成的颗粒的水性胶体悬浮液中，以将种子颗粒吸附到基材的表面上，或者在将种子颗粒吸附到颗粒之后去除光掩模 然后通过化学气相沉积将高表面能材料的均匀薄膜沉积到接种的基底上。
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公开(公告)号：US20080191712A1
公开(公告)日：2008-08-14
申请号：US11996913
申请日：2006-07-25
申请人： William R. Eisenstadt , Robert M. Fox , Tao Zhang , Jang Sup Yoon
发明人： William R. Eisenstadt , Robert M. Fox , Tao Zhang , Jang Sup Yoon
IPC分类号： G01R27/28
CPC分类号： G01R27/28 , G01R31/2884
摘要： An embedded s-parameter measurement system for measuring or determining an s-parameter is provided. The system includes an s-parameter test circuit for connecting to a port of a high-frequency multi-port device-under-test (DUT). The s-parameter test circuit includes a directional coupler for sampling a forward signal conveyed to the DUT and for sampling a reverse signal reflected by the DUT. The s-parameter test circuit also includes a peak detector electrically connected to the directional coupler for detecting a magnitude of a signal conveyed to the peak detector by the directional coupler. The s-parameter test circuit further includes a phase detector electrically connected to the directional coupler for determining a phase of a signal conveyed to the phase detector by the directional coupler, and at least one other s-parameter test circuit for connecting to another port of the high-frequency multi-port DUT.
摘要翻译： 提供了一种用于测量或确定s参数的嵌入式s参数测量系统。 该系统包括用于连接到高频多端口被测设备（DUT）端口的s参数测试电路。 s参数测试电路包括定向耦合器，用于对传送到DUT的正向信号进行采样，并对由DUT反射的反向信号进行采样。 s参数测试电路还包括电连接到定向耦合器的峰值检测器，用于检测由定向耦合器传送到峰值检测器的信号的幅度。 s参数测试电路还包括电连接到定向耦合器的相位检测器，用于确定由定向耦合器传送到相位检测器的信号的相位，以及至少一个其它s参数测试电路，用于连接到另一端口 高频多端口DUT。
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公开(公告)号：US07379716B2
公开(公告)日：2008-05-27
申请号：US11088933
申请日：2005-03-24
申请人： William R. Eisenstadt , Robert M. Fox , Jang Sup Yoon , Tao Zhang
发明人： William R. Eisenstadt , Robert M. Fox , Jang Sup Yoon , Tao Zhang
IPC分类号： H04B1/04
CPC分类号： H03F3/50 , H03F3/24 , H03F3/72 , H03F2200/105 , H03F2203/5031 , H04B17/19 , H04B17/318 , H04B2001/0408
摘要： A self-testing transceiver having an on-chip power detection capability is provided. The self-testing transceiver can include a semiconductor substrate and a transmitter having a high-power amplifier disposed on the substrate. The self-testing transceiver also can include a receiver disposed on the substrate for selectively coupling to an antenna. The self-testing transceiver can further include at least one power detector disposed on the semiconductor substrate for determining a power such as an RMS and/or peak-power of a signal at an internal node of the self-testing transceiver. Additionally, the self-testing transceiver can include a loopback circuit disposed on the substrate.
摘要翻译： 提供具有片上功率检测能力的自检收发器。 自检收发器可以包括半导体衬底和具有设置在衬底上的高功率放大器的发射器。 自检收发器还可以包括布置在衬底上的接收器，用于选择性地耦合到天线。 所述自检收发器还可以包括设置在所述半导体衬底上的至少一个功率检测器，用于确定所述自检收发器的内部节点处的信号的RMS和/或峰值功率的功率。 此外，自检收发器可以包括设置在基板上的环回电路。
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