公开(公告)号：US20100145651A1

公开(公告)日：2010-06-10

申请号：US11475684

申请日：2006-06-27

申请人： Dong Hoon Han ,  Abhijit Chatterjee ,  Selim Sermet Akbay ,  Soumendu Bhattacharya ,  William R. Eisenstadt

发明人： Dong Hoon Han ,  Abhijit Chatterjee ,  Selim Sermet Akbay ,  Soumendu Bhattacharya ,  William R. Eisenstadt

IPC分类号： G01R35/00

CPC分类号： H04B17/21

摘要： Various embodiments of self-calibration systems and methods are described. One method embodiment, among others, includes imposing an alternate test to components within the device, responsive to the imposition of the alternate test, providing test responses corresponding to the components, and substantially, simultaneously mapping each of the test responses to corresponding specification values of the components.

摘要翻译： 描述了自校准系统和方法的各种实施例。 一个方法实施例包括对设备内的组件施加替代测试，响应于施加替代测试，提供对应于组件的测试响应，并且基本上同时将每个测试响应映射到相应的规范值 组件。

公开(公告)号：US07756663B2

公开(公告)日：2010-07-13

申请号：US11475684

申请日：2006-06-27

申请人： Dong Hoon Han ,  Abhijit Chatterjee ,  Selim Sermet Akbay ,  Soumendu Bhattacharya ,  William R. Eisenstadt

发明人： Dong Hoon Han ,  Abhijit Chatterjee ,  Selim Sermet Akbay ,  Soumendu Bhattacharya ,  William R. Eisenstadt

IPC分类号： G01R35/00 ,  G01D18/00 ,  G01P21/00

CPC分类号： H04B17/21

摘要： Various embodiments of self-calibration systems and methods are described. One method embodiment, among others, includes imposing an alternate test to components within the device, responsive to the imposition of the alternate test, providing test responses corresponding to the components, and substantially, simultaneously mapping each of the test responses to corresponding specification values of the components.

摘要翻译： 描述了自校准系统和方法的各种实施例。 一个方法实施例包括对设备内的组件施加替代测试，响应于施加替代测试，提供对应于组件的测试响应，并且基本上同时将每个测试响应映射到相应的规范值 组件。