发明授权
- 专利标题: Phase detection circuit and method thereof and clock recovery circuit and method thereof
- 专利标题(中): 相位检测电路及其方法和时钟恢复电路及其方法
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申请号: US11185825申请日: 2005-07-21
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公开(公告)号: US07760030B2公开(公告)日: 2010-07-20
- 发明人: Dae-Seung Jeong , Ki-Mio Ueda , Duck Hyun Chang , Hwa-Su Koh , Young-Gyu Kang , Shu-Jiang Wang , Soon-Bok Jang , Nyun-Tae Kim
- 申请人: Dae-Seung Jeong , Ki-Mio Ueda , Duck Hyun Chang , Hwa-Su Koh , Young-Gyu Kang , Shu-Jiang Wang , Soon-Bok Jang , Nyun-Tae Kim
- 申请人地址: KR Gyeonggi-do
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Gyeonggi-do
- 代理机构: Harness, Dickey & Pierce, P.L.C.
- 优先权: KR10-2004-0057642 20040723
- 主分类号: H03L7/00
- IPC分类号: H03L7/00
摘要:
The phase detection circuit may allow an operating speed of a semiconductor circuit to be increased irrespective of whether a combinational logic circuit within the semiconductor circuit operates at lower operating speeds. The phase detection circuit may adjust a data rate of an input data signal and selectively enable reference signals and error signals. The phase detection circuit may be included within a clock data recovery circuit.