发明授权
- 专利标题： Modular probe system
- 专利标题（中）： 模块式探头系统
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申请号： US12023787申请日： 2008-01-31
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公开(公告)号： US07764079B1公开(公告)日： 2010-07-27
- 发明人: Mostafa Daoudi , Don Feuerstein , Denis Place
- 申请人： Mostafa Daoudi , Don Feuerstein , Denis Place
- 申请人地址： US VT Burlington
- 专利权人： SemiProbe LLC
- 当前专利权人： SemiProbe LLC
- 当前专利权人地址： US VT Burlington
- 代理机构： Downs Rachlin Martin PLLC
- 主分类号： G01R31/26
- IPC分类号： G01R31/26
摘要：
A modular probe system that includes components that are selected to test different devices-under-test (DUTs) in a number of different scientific fields. The system includes quick-release connectors that may be used to releasably secure components of the modular probe system to one another or to a mounting interface. These connectors permit quick and easy attachment and detachment of various components in a manner that permits a user to readily configure the probe system for each DUT.