Invention Grant
- Patent Title: Method for forming a stacked structure of an insulating layer and an organic semiconductor layer, organic field effect transistor and method for making same
- Patent Title (中): 用于形成绝缘层和有机半导体层的堆叠结构的方法,有机场效应晶体管及其制造方法
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Application No.: US11424672Application Date: 2006-06-16
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Publication No.: US07767488B2Publication Date: 2010-08-03
- Inventor: Nobuhide Yoneya
- Applicant: Nobuhide Yoneya
- Applicant Address: JP Tokyo
- Assignee: Sony Corporation
- Current Assignee: Sony Corporation
- Current Assignee Address: JP Tokyo
- Agency: K&L Gates LLP
- Priority: JP2005-186554 20050627
- Main IPC: H01L51/40
- IPC: H01L51/40

Abstract:
A method for making an organic field effect transistor of a bottom gate/bottom contact type or a bottom gate/top contact type is provided. The method comprises (a) forming a gate electrode 12 on a support and forming a gate insulating layer 13 on the support 10 and the gate electrode 12, and (b) forming, on the gate insulating layer 13, source/drain electrodes 14 and an organic semiconductor region 15 made of an organic semiconductor material and constituting a channel forming region 16. The gate insulating layer 12 is formed by applying a solution of a mixture of an insulating polymer material and a surface treating agent onto the support 10 and the gate electrode 12 and drying. The organic field effect transistors are also provided.
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