Invention Grant
US07767501B2 Devices using abrupt metal-insulator transition layer and method of fabricating the device
失效
使用突变金属 - 绝缘体过渡层的器件及其制造方法
- Patent Title: Devices using abrupt metal-insulator transition layer and method of fabricating the device
- Patent Title (中): 使用突变金属 - 绝缘体过渡层的器件及其制造方法
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Application No.: US11721069Application Date: 2005-12-05
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Publication No.: US07767501B2Publication Date: 2010-08-03
- Inventor: Doo-Hyeb Youn , Hyun-Tak Kim , Byung-Gyu Chae , Sung-Lyul Maeng , Kwang-Yong Kang
- Applicant: Doo-Hyeb Youn , Hyun-Tak Kim , Byung-Gyu Chae , Sung-Lyul Maeng , Kwang-Yong Kang
- Applicant Address: KR Daejeon
- Assignee: Electronics and Telecommunications Research Institute
- Current Assignee: Electronics and Telecommunications Research Institute
- Current Assignee Address: KR Daejeon
- Agency: Ladas & Parry LLP
- International Application: PCT/KR2005/004116 WO 20051205
- International Announcement: WO2006/062317 WO 20060615
- Main IPC: H01L21/335
- IPC: H01L21/335

Abstract:
The abrupt metal-insulator transition device includes: an abrupt metal insulator transition material layer including an energy gap of less than or equal to 2 eV and holes within a hole level; and two electrodes contacting the abrupt metal-insulator transition material layer. Here, each of the two electrodes is formed by thermally treating a stack layer of a first layer formed on the abrupt metal-insulator transition material layer and comprising Ni or Cr, a second layer formed on the first layer and comprising In, a third layer formed on the second layer and comprising Mo or W, and a fourth layer formed on the third layer and comprising Au.
Public/Granted literature
- US20090230428A1 DEVICES USING ABRUPT METAL-INSULATOR TRANSITION LAYER AND METHOD OF FABRICATING THE DEVICE Public/Granted day:2009-09-17
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