Invention Grant
- Patent Title: Photo detector unit and exposure apparatus having the same
- Patent Title (中): 光电检测器单元和具有该光电检测器单元的曝光设备
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Application No.: US11438348Application Date: 2006-05-23
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Publication No.: US07768625B2Publication Date: 2010-08-03
- Inventor: Makoto Ogusu
- Applicant: Makoto Ogusu
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2005-162946 20050602
- Main IPC: G03B27/42
- IPC: G03B27/42

Abstract:
An exposure apparatus includes (a) a projection optical system to project a reticle pattern onto a plate by using a light from a light source, and (b) a photo detector unit to detect the light via the projection optical system. The photo detector unit includes (i) a substrate, which is patterned with a wiring pattern and transmits the light, (ii) a detector to detect the light, and (iii) a bump to space the substrate from the detector, and to electrically connect the detector and the wiring pattern of the substrate.
Public/Granted literature
- US20060274297A1 Photo detector unit and exposure apparatus having the same Public/Granted day:2006-12-07
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