Invention Grant
US07768660B1 Non-destructive approach to ellipsometric monitoring of a film coating on the inner surface of a tube shaped sample 有权
在管状样品的内表面上的薄膜涂层的椭圆测量的非破坏性方法

Non-destructive approach to ellipsometric monitoring of a film coating on the inner surface of a tube shaped sample
Abstract:
Disclosed is the use of a focused electromagnetic beam which is caused to impinge on the top surface of a tube shaped sample, to investigate a film coating on its inner surface during fabrication thereof and/or thereafter.
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